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Nanofinder® FLEX G
ㆍ제조사 Tokyo Instruments
Nanofinder FLEX G

Three Functions in One : AFM-Raman Microsopy System Leading the Field


3D Confocal Raman Microscopy:

  · High sensitivity: Detection of the weak 4th order Si peak
  · High spatial resolution: < 200 nm
  · High speed: < 3 ms/point (spectrum)


AFM-Raman:

  · Simultaneous or sequential measurements of
  · AFM and Raman images from the same sample area
  · Surface topography with simultaneous 2D confocal Raman
  · AFM resolution:0.1 nm
  · High spatial resolution: < 450 nm(Raman)
  · High speed: < 7 ms/point (spectrum)


Tip-Enhanced Near-field Raman:

  · TERS (Tip-enhanced Raman spectroscopy)
  · Spatial resolution < 50 nm by Near-Filed Raman method


Features:

  · Stable experimental conditions

  · Granite Frame

  · Smart Sliding Mechanism (SSM)

  · LED Illuminator

  · High Throughput

  · Small Footprint

  · Polarization Measurement